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...December e electron diffraction contributed by becca weiner with modifications d morgan the following is a brief description of how to collect data using jeol jem fs start finding area you want examine adjusting strength beam an appropriate level see below for ways do this and making sure that image recorded under these conditions focused properly close focus but slightly when objective lens set standard then follow steps in order put into mode deal properties record if decide change size or spot insert selected aperture will need redo some first seven make optical axis microscope centered cycle between spots sizes return one use center shift object from which information within switch sa diff button on right hand knobset pattern knob also have very sharp unscattered aka undiffracted f etc be as small point like possible shows signs astigmatism elongation direction rotates passes through remove intermediate stigmators toggle il stig alignment window temcon def knobs both knobsets minim...