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...Volume number november december journal of research the national institute standards and technology electron diffraction using transmission microscopy leonid a bendersky frank via combination with other methods w gayle microscope is powerful this paper provides survey some method for characterizing structure work enabled through mi materials including perfect crystals croscopy defect structures advantages elec gaithersburg md tron over e g key words crystal crystallog x ray or neutron arise from extremely raphy defects phase short wavelength pm strong transitions quasicrystals nist gov atomic scattering ability to exam ine tiny volumes matter nm science engineer accepted august ing laboratory has history discovery characterization new alone in available online http www jres introduction use solve crystallo atomicpotential form spots on back focal graphic problems was pioneered soviet union by plane after being focused objective lens b k vainshteinandhiscolleaguesasearlyasthes diffracte...