Contents i CONTENTS I INTRODUCTION.. V HAPTER ECHNIQUES C 1 SPM T ... 1 1.1 Scanning Tunneling Microscopy.. 2 1.2 Atomic Force Microscopy.. 5 1.2.1Contact AFM... 7 ...
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...Contents i introduction v hapter echniques c spm t scanning tunneling microscopy atomic force contact afm non intermittent magnetic lateral other techniques modulation phase detection electrostatic capacitance thermal near field optical nanolithography spms as surface analysis tools spectroscopy vs distance curves environments ultra high vacuum ambient liquid electrochemical further reading ii he canner s scanner design and operation nonlinearities intrinsic nonlinearity hysteresis creep aging cross coupling software correction hardware capacitive strain gauge tests for linearity step profile in z robes p cantilevers properties of tip shape resolution how to select a probe handling iii mage rtifacts convolution with physics...